The SCANSTA111MT/NOPB is an enhanced SCAN Bridge extends the IEEE Std. 1149.1 test bus into a multi-drop test bus environment. The advantage of a multi-drop approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modules. Each SCANSTA111 supports up to 3 local IEEE 1149.1 scan rings which can be accessed individually or combined serially. Addressing is accomplished by loading the instruction register with a value matching that of the slot inputs. Backplane and inter-board testing can easily be accomplished by parking the local TAP Controllers in one of the stable TAP Controller states via a Park instruction. The 32-bit TCK counter enables built in self-test operations to be performed on one port while other scan chains are simultaneously tested.
True IEEE 1149.1 hierarchical and multidrop addressable capability
7 slot inputs support up to 121 unique addresses
3 IEEE 1149.1 Compatible configurable local scan ports
Mode register0 allows local TAPs to be bypassed
LSP ACTIVE Outputs provide local port enable signals for analogue busses supporting IEEE 1149.4
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