The F77206B200G300 is a spring contact Standard Probe with gold-plated beryllium copper contacts, suitable for in-circuit and functional test (ICT/FCT). This F772 series probe is used in dual-stage fixtures together with the F797 and it permits a variable projection height. It is used for used for a fixed projection height of 10mm and is identical to the threaded probe F732.
- Gold-plated nickel silver barrel
- Silver-plated music wire spring
- 25mR Typical probe resistance
- 16A Constant current
工业, 测试与测量
(EN)
